Showing results: 3271 - 3285 of 4500 items found.
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Application and Threat Intelligence (Subscription) -
Keysight Network Applications and Security
Test and simulation conditions must reflect the latest security threats and applications so that you can ensure your equipment and systems will perform reliably and protect networks from the most advanced and malicious traffic. With Ixia's BreakingPoint Application and Threat Intelligence (ATI) program, we do the research for you by identifying and generating security attacks and application protocols that keep you current.
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Maury Microwave Corporation
AMCAD Engineering has created professional, industry-proven pulsing technology for both pulsed-bias load pull (Pulsed Load Pull, PLP) and 50ohm transistor test applications. Systems come equipped with a mainframe controller which includes integrated power supplies and integrated input pulser with ±25V/200mA capability. The external output pulser module (probes, pulsers) is configured for 120V/30A pulsing.
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ECAD System 2002 -
CM Technologies Inc.
The ECAD System 2002 is a portable, ruggedized tester that can be used for troubleshooting and condition monitoring of installed circuits, cables and wiring harness. The ECAD tester is a combination of traditional electrical measurements, a database for storing test results, and data analysis software. This powerful combination allows a user to evaluate the condition of all circuit components in a logical and straightforward manner from one end of the circuit.
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Optronis GmbH
Whether it’s needed in the laboratory, at external sites or for crash tests, you can expect high performance every time, every place and everywhere from Optronis’ slow motion cameras of CamRecord-CR and CamRecord-Sprinter series. The systems are particularly easy to operate. The high level of light sensitivity of these cameras gives you a clear view of your subject, even in poor light conditions.
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CP-4 -
Bruker Nano Surfaces
he new Bruker CP-4 CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes. Reproduces full-scale wafer polishing-process conditions. Provides unmatched measurement repeatability and detail. Performs tests on small coupons rather than whole wafers for substantial cost savings.
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TS-1650 -
Testek Solutions
Testek’s NextGen TS-1650, LRM & CATE series provides economical and high speed, certified correct testing of a wide range of aircraft avionics and control components. The Testek ATE family are universal, automatic test systems, one of which is best for your application. UTC Aerospace formerly known as Hamilton Sundstrand approves and recommends Testek’s TS-1650, LRM & CATE series.
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V810 S2EX -
Kyoritsu Testsystem Co., Ltd.
V810 is "3D Automatic X-ray inspection System" that corresponds to the double side mounting SMT-PCB that is not able to be checked by a transmission-type X-ray machine. It has the ability to detect a wide range of defects, and It have 100% complete defect detection capability in the Hip-defective.And, it is the inspection machine of world's highest level that combines the ability of the ultra-fast test speed and the lowest false call positives further.
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SomatXR CX23-R -
HBM, Inc
The ultra-ruggedized SomatXR CX22B-R data recorder is intended for use in harsh environments and reliably stores measured data in applications such as vehicle tests. The recorder records data from other SomatXR modules using an Ethernet connection. At the same time, FireWire allows its use as a gateway for direct data transmission to the PC. Both centralized and distributed measurement systems can thus be implemented.
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C60 -
Cypher Instruments
The C60 investigates the opaque world of analog networks. The unit operates in two test modes. It can measure the frequency response of a two port system producing a gain/loss and phase graph. It can also measure the reactive response of a two terminal network producing an impedance/admittance and phase graph. Electronic, electrical, electro-acoustic and other networks can be tested with sine wave excitation and the results displayed on a PC.
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HGL Dynamics Inc
Hummingbird features a Gigabit Ethernet connection, allowing acquired data to be streamed to laptop or PC. It can also be used as a standalone data logger, with its built-in CPU and disk drive.The unit is supplied in an ultra-rugged milled aluminium housing for use in close proximity to the test article.The Hummingbird is completely compatible with HGL's existing range of data acquisition, real-time monitoring, analysis and archiving systems.
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779633-01 -
NI
8-Slot, Quiet, Up to 3 GB/s PXI Chassis—The PXIe‑1062Q is designed for a wide range of test and measurement applications and provides a high-bandwidth backplane. The NI PXIe‑1062Q has four PXI peripheral slots, one PXI Express slot with system timing capabilities, and two PXI Express hybrid slots that accept both PXI and PXI Express peripheral modules.
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N4392A -
Keysight Technologies
The new Keysight N4392A is an ultra-compact, portable fully integrated optical modulation analyzer with a 15'' laptop-size screen. It is optimized for daily R&D work and designed for the most affordable performance verification in manufacturing and component test for 40/100G components, modules and systems. It is the first optical modulation analyzer that provides built-in performance verification and recalibration, extending the factory recalibration cycles significantly.
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ITE -
JGB Consulting, Inc.
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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SAJE -
SiliconAid Solutions, Inc.
SAJE is the SiliconAid Suite of JTAG related standards focused tools for chip development, verification, validation and patterns generation of ATE, Board, and System Test. Each tool can be used as a point tool by itself to compliment other tools in your flow. However, the SAJE Tool Suite used together in a flow can provide a total solution that also leveraging previous steps for debug and analysis.
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LXinstruments GmbH
An electronic load offers the possibility of testing the specimen under different loads. Various load changes are simulated, as they can occur in normal operation. For this purpose, the relevant load current is set in a defined range and electronically controlled. For the test, different operating states are either programmed or entered into the system via an interface (USB, RS-232, GPIB...). For easy handling and quick use, there are four operating modes.